Orbit

年度 2005
全部作者 Yuh-Chung Hu*, Wei-Hsin Gau, and Wei-Hsiang Tu,
論文名稱 “Mechanical Characterization of Thin Films by the Capacitance-Voltage Measurement of Microstructures,” 2005 International Conference on Advanced Manufacture (ICAM2005), Paper No. A061, Nov. 28 - Dec.02, Taipei, Taiwan.
檔案
  • 304_17a2c669.pdf
  • 發表日期 1970-01-01