年度 2007
全部作者 Yuh-Chung Hu*, Chung-Sheng Wei, Chun-Ching Hsiao, and David T. W. Lin,
論文名稱 “Extracting the Young’s Modulus and Stress Gradient of Thin Films from the Pull-in Voltage of a Micro Curled Cantilever Beam,” The Second Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems (IEEE NEMS 2007), Paper No. 092,
  • 294_c5013cc7.pdf
  • 發表日期 2007-01-01