Orbit

年度 2008
全部作者 Yuh-Chung Hu*, Jia-Hong Lin, Kuo-Yi Huang, and Wan-Chun Chuang,
論文名稱 “An Electrical Testing Method of the Structural Material of Micro Devices,” The Third Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems (IEEE NEMS 2008), pp. 69-73, Jan. 6-9, Sanya, China.
檔案
  • 292_a13dbb9a.pdf
  • 發表日期 2008-01-01