年度 2006
全部作者 Yuh-Chung Hu*, David T. W. Lin, and Guan-De Lee,
論文名稱 “A Closed Form Solution for the Pull-in Voltage of the Micro Bridge with Initial Stress subjected to Electrostatic Loads,” The First Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems (IEEE NEMS 2006), pp.759-763, Jan. 18-
  • 299_1f1efb0d.pdf
  • 發表日期 1970-01-01