Orbit

年度 2007
全部作者 Yuh-Chung Hu* and Po-Yuan Huang
論文名稱 “Wafer-level microelectromechanical system structural material test by electrical signal before pull-in,” Applied Physics Letters, 90(12), 121908 (2007). (SCI IF=4.127)
發表日期 1970-01-01
檔案
  • 276_24b34e23.pdf