Orbit

年度 2007
全部作者 Yuh-Chung Hu*, Wen-Pin Shih, and Guan-De Lee
論文名稱 “A method for mechanical characterization of capacitive devices at wafer-level via detecting the pull-in voltages of two test-bridges with different lengths,” Journal of Micromechanics and Microengineering, 17(6), 1099-1106 (2007). (SCI IF=2.499)
發表日期 1970-01-01
檔案
  • 277_7715ca7d.pdf